Reliable VLSI system design, low-power VLSI system design, many-core micro-processor design & parallel computing, VLSI system testing & design for testability, VLSI design for deep learning.
Wen-Ben Jone was an Assistant and Associate Professor of the Department of Computer Science at New Mexico Institute of Mining and Technology, Socorro, New Mexico, 1987-1993. From 1993 to 2000, he joined the Department of Computer Engineering and Information Science, National Chung-Cheng University, Chiayi, Taiwan, as a Visiting Associate Professor and then a Full professor. From 2001, he has been an Associate Professor of the Department of Electrical Engineering & Computing Systems, University of Cincinnati. He has advised more than 70 MS/PhD theses in the area of VLSI design and test. He has published more than 60 journal papers and 100 conference papers. Dr. Jone is a co-recipient of the 2003 IEEE Donald G. Fink Prize Paper Award, the best paper award of 2008 International Symposium on Low-Power Electronics & Design, and 2012 International Symposium on VLSI Design, Automation & Test. He has been a program committee of VLSI-related conferences such as IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.